Dr. Ralph Christoph (Werth Messtechnik Inc.) delivered a keynote lecture on “Coordinate measuring systems with optical sensors, X-ray computed tomography, and multi-sensor technology” at the University of Jena (Germany) on December 03rd, 2024.

Abstract. In addition to conventional coordinate measuring technology with tactile sensors, systems with optical sensors and X-ray computed tomography have become particularly popular in recent years for a wide range of applications. Starting with the most important operating principles, the presentation will outline the performance limits, particularly with regard to measurement speed and accuracy. Various application examples from industry and research provide information on potential fields of application, also taking economic aspects into account.

Bio. Ralf Christoph studied at the Friedrich Schiller University in Jena from 1977 to 1981 and received his doctorate in 1985 in the field of the application of image sensors for optical coordinate metrology. In 1989, he completed his habilitation at the same university in the field of optical sensor technology for geometric measurements. Since 1990, he has been Head of Development at Werth Messtechnik GmbH in Giessen and was appointed Managing Partner in 1993. With over 30 years of experience, he is actively involved in the work of VDI, DIN and ISO in the development of guidelines and standards in the field of coordinate measuring technology.